- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/04 - STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
Patent holdings for IPC class G01Q 60/04
Total number of patents in this class: 17
10-year publication summary
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0
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2
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1
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0
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3
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2
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0
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1
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0
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1
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| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Centre National de La Recherche Scientifique | 9632 |
2 |
| Ecole Polytechnique | 308 |
2 |
| Quantum Silicon Inc. | 24 |
2 |
| Xallent Inc. | 13 |
2 |
| Robert Bosch GmbH | 40953 |
1 |
| Varian Semiconductor Equipment Associates, Inc. | 1282 |
1 |
| ASML Holding N.V. | 542 |
1 |
| Ceské Vysoké Ucení Technické V Praze | 57 |
1 |
| Immune Disease Institute, Inc. | 33 |
1 |
| Korea Research Institute of Standards and Science | 639 |
1 |
| Xallent, LLC | 4 |
1 |
| Paris Sciences et Lettres - Quartier Latin | 170 |
1 |
| Sorbonne Universite | 1068 |
1 |
| Other owners | 0 |